The 1st Workshop on Security, Reliability and Safety will be held on April 15-18, 2015 at Jeju National University International Center, Jeju Island, Korea
The 1st Security, Reliability and Safety workshop will be the most comprehensive workshop focused on the various aspects of advances in Security, Reliability and Safety. Our workshop provides a chance for academic and industry
professionals to discuss recent progress in the area of Security, Reliability and Safety.
The goal of this conference is to bring together the
researchers from academia and industry as well as practitioners to
share ideas, problems and solutions relating to the multifaceted
aspects of the Security, Reliability and Safety.
1) Security Engineering and Its Application
Security Requirements Engineering
Security in System/Software/Product Development Site
Security in Development Processes
Security Maturity Model
Security Evaluation Criteria and Methodology
New Idea, Theory and Paradigm for Security
2) Security and Assurance in Operational Area
Security Policy, Strategy and Management
Authentication and Identity Management
Security Education and Training
Personnel Security and Privacy
Trust Negotiation, Establishment and Management
Vulnerability, Threat, and Risk Analysis
3) Security and Assurance in Technology Area
Agent and Mobile Code Security
Authorization and Access Control
Biometrics Security and Applications
Data Integrity and Privacy
Intrusion Detection and Prevention
Distributed System Security
Key Management and Recovery
Mobile and Ad hoc network security
Operating System Security
Secure Hardware and Software Design
Smartcards and Chip Security
RFID, Sensor Network, Ubiquitous Computing Security
4) Security and Assurance in Commercial Area
Cell phone, PDA, and Potable Device Security
Biometrics Products and its Applications
Firewall, IDS, Anti-virus, and other Security Products
E-Commerce and E-Government Security
Intellectual Property Protection
Internet and Web Services Security
5) Security and Assurance in Military Area
Information Warfare and Countermeasures
Cyber-attack and Cyber-terrorism
Anti-tamper and TEMPEST
Physical Security and Soldier Security
E-bomb and Electronic Attack
Tactical Communication and Network Security
Sensor-to-shooter/Command Control System Security
6) Reliability assessment methods
Uncertainty quantification and propagation using probabilistic and non-probabilistic methods
Engineering decisions under uncertainty
Probabilistic and non-probabilistic safety assessment
Reliability and safety relationship
Engineering design for safety and reliability
Reliability-based condition assessment
Reliability-based design optimisation
Stochastic finite elements
Other relevant topics
| IMPORTANT DATES
Review Paper Submission: March 15, 2015
Acceptance Result Notification: March 25, 2015
Camera Ready and Registration: April 5, 2015
| ELECTRONIC SUBMISSION
All papers should be submitted by e-mail for review (at least 4 pages, max 8 pages). Every submitted paper will be carefully reviewed by at least three members of the International Program Committee.
Just focus on and express your research contributions to reduce the time for review process. Do not exceed to 8 pages in LNCS paper format.
Please download paper format by clicking here.
Please visit and submit your paper:
If you met problems about submission site, just send your paper to email@example.com.
Only 50 high quality papers will be accepted, and will be published by SCOPUS or EI indexed journals.
1. Conference Proceedings:
All papers accepted and registered will be included in conference proceedings, ASTL series, and will be sent to EI.
2. Journal Publish:
All accepted 50 papers will be included in one of international journals after revision and extension.
In the acceptance letter, target journal will be noticed together.
All attendees must make the registration. At least one author per paper must be accompanied by one Mandatory Registration. Without a dedicated registration, the paper cannot be included in the Proceedings / Journals.
We recommend credit card registration:
Online Registration Site: Click Here!
| ORGANIZATION COMMITTEE
International Editorial Committee
Aniruddha Bhattacharjya, Amrita Vishwa VidyaPeetham, India
Chantana Chantrapornchai, Silpakorn University, Tailand
Daesung Lee, Catholic University of Pusan, Korea
Gyesik Lee, Hankyong National University, Korea
Hai Jin, Huazhong University of Science and Technology, China
Hoon Ko J. E., Purkinje University, Czech Republic
Jan deMeer, Brandenburg Technical University, German
Javier Garcia-Villalba, Complutense University of Madrid, Spain
Junbeom Hur, Chung-Ang University, Korea
Jun-Cheol Jeon, Kumoh National Institute of Technology, Korea
Kwangman KO, Sangj University, Korea
Pierre Dusart, University of Limoges, France
Radu G. Andrei, PluraTech, USA